Hybrid defect detection for recording channels
US8339720B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2012 |
| Grant date | Dec 25, 2012 |
| Priority date | — |
| Expiry date | Mar 13, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/2516
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems and computer program products for performing hybrid defect detection are disclosed. A hybrid defect detection mechanism may be used to detect various classes of defects (e.g., long and shallow defects, and short and deep defects) while reducing the probability of a miss or false alarm. In some implementations, the hybrid defect detection mechanism may utilize defect detectors to each receive signal samples and apply a different set of parameters indicating a different respective window to the signal samples. Each defect detector may generate a corresponding output based on a count of signal samples within the corresponding window that are associated with abnormal signal quality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.