Methods and systems for determining optimal features for classifying patterns or objects in images
US8340437B2 · kind B2 · utility
29Cited by
5References
63Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 29, 2008 |
| Grant date | Dec 25, 2012 |
| Priority date | — |
| Expiry date | Sep 13, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/03
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Provided are methods for determining optimal features for classifying patterns or objects. Also provided are methods for image analysis. Further provided are methods for image searching.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.