Process device with sampling skew
US8340791B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 1, 2009 |
| Grant date | Dec 25, 2012 |
| Priority date | — |
| Expiry date | Dec 25, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01F23/804
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An industrial process device for monitoring or controlling an industrial process includes a first input configured to receive a first plurality of samples related to a first process variable and a second input configured to receive a second plurality of samples related to a second process variable. Compensation circuitry is configured to compensate for a time difference between the first plurality of samples and the second plurality of samples and provide a compensated output related to at least one of the first and second process variables. The compensated output can comprise, or can be used to calculate a third process variable. The third process variable can be used to monitor or control the industrial process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.