System and method for testing image capturing function of an electronic device
US8345104B2 · kind B2 · utility
1Cited by
1References
19Claims
0Family size
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Key dates
| Filing date | Feb 6, 2010 |
| Grant date | Jan 1, 2013 |
| Priority date | — |
| Expiry date | Apr 21, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for testing an image capturing function of an electronic device includes following blocks. A test program package with an exemplar image is installed in the electronic device. The electronic device is placed on a test fixture used for limiting an image capturing position and an image capturing angle of the electronic device. The electronic device captures an image to be tested by the electronic device. The image to be tested is compared with the exemplar image to determine whether the image capturing function of the electronic device is satisfactory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.