Optical information analyzing device and optical information analyzing method
US8345237B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 23, 2011 |
| Grant date | Jan 1, 2013 |
| Priority date | — |
| Expiry date | Dec 23, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/1452
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical information analyzing device includes an irradiating unit that irradiates irradiation light to specimens, a transmitted light receiving unit that receives transmitted light and detects the transmitted light as a transmitted light signal, a scattering/fluorescent light receiving unit that receives lateral scattering light and fluorescent light and detects the lateral scattering light and the fluorescent light as a scattering/fluorescent light signal, a nozzle position adjusting mechanism, and an analyzing unit that measures the optical information on the specimen on the basis of the detected transmitted light signal and the detected scattering/fluorescent light signal and analyzes the specimen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.