Displacement/distortion measuring method and displacement/distortion measuring apparatus
US8345333B2 · kind B2 · utility
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2References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2006 |
| Grant date | Jan 1, 2013 |
| Priority date | — |
| Expiry date | Jul 23, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are a displacement/distortion measuring method and a displacement/distortion measuring apparatus for easily and highly accurately measuring displacement or distortion of an object. An image of the surface of the measuring object is picked up by a line scanner apparatus adhered or brought close to the surface of the measuring object. The image is taken, displacement or distortion is measured by image analysis of the image of the measuring object surface prior to time lapse and that after time lapse, and displacement or distortion measuring results are outputted.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.