Method and system for dynamic probabilistic risk assessment

US8346694B2 · kind B2 · utility

Assignee

• University of Virginia Patent Foundation · US

Inventors

• Joanne Bechta Dugan · Crozet, US
• Hong Xu · Nanhu, CN

Key dates

• Filing date: Dec 21, 2005
• Grant date: Jan 1, 2013
• Expiry date: May 30, 2028

Classification

• Technology area (CPC G): Physics
• CPC primary: G06Q10/0635
• WIPO field: IT methods for management
• WIPO sector: Electrical engineering

Abstract

The DEFT methodology, system and computer readable medium extends the applicability of the PRA (Probabilistic Risk Assessment) methodology to computer-based systems, by allowing DFT (Dynamic Fault Tree) nodes as pivot nodes in the Event Tree (ET) model. DEFT includes a mathematical model and solution algorithm, supports all common PRA analysis functions and cutsets. Additional capabilities enabled by the DFT include modularization, phased mission analysis, sequence dependencies, and imperfect coverage.