Method and apparatus for sample analysis
US8347688B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 13, 2009 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Jul 8, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2030/685
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for analyzing samples, such as gas samples, are described. One method comprises providing a gas sample, increasing pressure applied to the gas sample to compress the sample to a smaller volume and provide a pneumatically focused gas sample, and analyzing the pneumatically focused gas sample using any of a variety of analytical techniques. Also disclosed are systems for gas analysis, including systems for analysis of pneumatically focused, and thereby concentrated, gas samples and for analysis of particulate matter in gas samples. Analytical systems constructed within personal computer cases also are disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.