Depth mapping using multi-beam illumination
US8350847B2 · kind B2 · utility
45Cited by
55References
34Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 21, 2008 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Jun 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for mapping an object (28) includes illuminating the object with at least two beams (37, 38) of radiation having different beam characteristics. At least one image of the object is captured under illumination with each of the at least two beams. The at least one image is processed to detect local differences in an intensity of the illumination cast on the object by the at least two beams, and the local differences are analyzed in order to generate a three-dimensional (3D) map of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.