Target and three-dimensional-shape measurement device using the same
US8351025B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2009 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Jul 31, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C15/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A target set in a to-be-measured object and used for acquiring a reference value of point-cloud data, the target includes a small circle surrounded by a frame and having the center of the target, a large circle surrounded by the frame and disposed concentrically with the small circle so as to surround the small circle, a low-luminance reflective region located between the frame and the large circle and having the lowest reflectivity, a high-luminance reflective region located between the large circle and the small circle and having the highest reflectivity, and an intermediate-luminance reflective region located inside the small circle and having an intermediate reflectivity which is higher than the reflectivity of the low-luminance reflective region and which is lower than the reflectivity of the high-luminance reflective region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.