Method and system for the automated testing and/or measuring of a plurality of substantially identical components using X-ray radiation
US8351567B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 23, 2010 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Feb 13, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for automated testing and/or measurement of a plurality of substantially identical components by means of X-ray radiation comprises a testing/measuring device with an X-ray device, a protection cabin surrounding the testing/measuring device, a conveying device for continuously conveying components to or away from the testing/measuring device, and a control/evaluation unit, which is set up for automated control of the system and for evaluation of the X-ray signals. The testing/measuring device comprises a support and a rotor mounted on the support so as to be continuously rotatable, the X-ray device being arranged on the rotor and the conveying device being set up for serial conveying of the components through the rotor and the control/evaluation unit for computer tomographic evaluation of the X-ray signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.