Method for generating high resolution surface topology map using surface profiling and surveying instrumentation
US8352189B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2009 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Mar 29, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C21/1652
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for generating a high-resolution surface topology map of a surface using surface profiling data combined with data collected from a surveying instrument. The system and method involve collecting a plurality of survey sample points and collecting a plurality of profile sample points of the surface. The profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or “filled-in” between the survey sample points. The high-resolution surface topology map is generated from the merging of the survey and profile sample points. In various embodiments, the survey data may be generated using an inertial profiler, an inclinometer based walking device, or a rolling-reference type profile device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.