Manipulable aid for dimensional metrology
US8352212B2 · kind B2 · utility
49Cited by
11References
34Claims
0Family size
Assignee
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Key dates
| Filing date | Nov 18, 2009 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Jun 18, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/047
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A manipulable aid which is separate and distinct from the probe of a CMM permits a CMM operator to more directly interact with a CMM measurement volume to align a workpiece, configure a measurement path, and/or program a dimensional metrology application.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.