Configurable test suite
US8352791B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2010 |
| Grant date | Jan 8, 2013 |
| Priority date | — |
| Expiry date | Nov 24, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2236
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for testing a control module includes a microprocessor, where the microprocessor has a programming environment. The programming environment has a test data structure, a configuration data structure, and a monitor data structure each containing data. At least one test data instance is associated with the test data structure and at least one configuration data instance is associated with the configuration data structure. The configuration data instance is a diagnostic test that monitors a parameter of the microprocessor, and the monitor data structure creates the test data instance such that each test data instance corresponds to one of the configuration data instances. The program includes a first control logic for associating the test data structure, the configuration data structure and the monitor data structure as part of a core infrastructure portion of the programming environment, where the core infrastructure portion of the program is static.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.