Patent · US Active

Early defect removal model

US8352904B2 · kind B2 · utility

21Cited by
12References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 24, 2008
Grant dateJan 8, 2013
Priority date
Expiry dateNov 9, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/008
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and a computer program product for modeling early defect removal are provided. The method includes selecting a first set of software development practices to model as a baseline plan, where each of the software development practices has an associated defect removal efficiency (DRE) and is associated with a development phase of a software development cycle. The method also includes selecting a second set of the software development practices to model as a to be plan, where each of the software development practices has a configurable DRE for the to be plan. The method further includes calculating defect removal in each of the development phases as a function of the DRE values, adjusting configuration settings for the to be plan to shift an amount of the defect removal earlier in the development phases of the to be plan as compared to the baseline plan, and outputting a graphical representation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.