Method for characterizing dielectric loss tangent
US8354833B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 30, 2010 |
| Grant date | Jan 15, 2013 |
| Priority date | — |
| Expiry date | May 21, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2694
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing dielectric loss tangent of a dielectric material. The method includes: introducing an incident wave in a mismatched transmission line; measuring a first insertion loss from a first resulting standing wave, at a given frequency; augmenting the mismatched transmission line with the dielectric material; introducing the incident wave in the transmission line augmented with the dielectric material; measuring a second insertion loss from a second resulting standing wave, at the given frequency; and calculating the dielectric loss tangent based on the differences between the first and second measured insertion losses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.