Methods and systems for detecting the presence, or determining the location or the size, or detecting changes of material properties, of an object within a predefined space
US8354850B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 16, 2008 |
| Grant date | Jan 15, 2013 |
| Priority date | — |
| Expiry date | Jul 20, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V3/088
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting the presence, and/or determining the location, and/or detecting changes in the material properties, of a first object (4) within a predefined space (12) and compensating for the disturbance caused by a second object, where the method comprises the following steps: providing at least a first and a second electrode (6) capacitively coupled to each other; conductively applying an electrical signal to each of the first and second electrodes (6), the electrical signals being different for the first and second electrodes (6); for each of the electrodes (6) measuring the current signal through, and/or the voltage signal on, the electrode (6); deriving from the measured values an indication of the disturbance caused by the second object; and deriving from the measured values and the indication of the disturbance a disturbance-compensated indication of the presence, and/or the location, and/or changes in the material properties, of the first object (4).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.