Sample adequacy measurement system having a plurality of sample tubes and using turbidity light scattering techniques
US8355132B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 12, 2009 |
| Grant date | Jan 15, 2013 |
| Priority date | — |
| Expiry date | Aug 15, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N35/0099
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sample adequacy measurement system having sample tubes and a housing having a receptacle to receive the sample tubes. The housing has sample adequacy measurement stations that each have a light source and a sample detector. The light source generates an illumination beam directed into one of the sample tubes. The sample detector is positioned along the tube, and receives at least a portion of the illumination beam scattered by turbidity in the sample tube. The detector is positioned at the end of an emitted beam path that extends in a plane that is perpendicular to the vertical direction and is oriented at a non-perpendicular angle with respect to the longitudinal axis of the sample tube unit. This reduce the likelihood that the emitted beam will pass through a damaged portion of the respective one of the sample tubes by passing the light through a protected portion of the tube.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.