Method for detecting high impedance faults by analyzing a local deviation from a regularization
US8355882B2 · kind B2 · utility
1Cited by
4References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2008 |
| Grant date | Jan 15, 2013 |
| Priority date | — |
| Expiry date | Apr 15, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting high impedance faults, including: receiving an input waveform from a circuit; computing a root mean square of the input waveform; fitting a regression line to the root mean squares; computing a deviation between the regression line and the root mean squares; determining whether the deviations are above a threshold; and outputting a value indicating that a fault has occurred in the circuit when the deviation is above the threshold and outputting a value indicating that a fault did not occur in the circuit when the deviation is below the threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.