Patent · US Active

Method and device for measuring optical characteristics of an object

US8357915B2 · kind B2 · utility

19Cited by
1References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 27, 2009
Grant dateJan 22, 2013
Priority date—
Expiry dateNov 11, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/6456
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method and device for measuring the multi-dimensional distribution of optical characteristics of an object, by carrying out the following operations:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.