Apparatus and method for analyzing a fluorescent sample disposed on a substrate
US8357918B2 · kind B2 · utility
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3References
15Claims
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Key dates
| Filing date | Feb 5, 2008 |
| Grant date | Jan 22, 2013 |
| Priority date | — |
| Expiry date | Nov 2, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/274
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for analysing a fluorescent sample disposed on a substrate comprises a first processor for producing first and second electrical signals derived from respective first and second light signal components received from a sample and from a substrate. The apparatus produces the first and second electrical signals such that there is a phase difference between phases of the first and second electrical signals. The apparatus comprises a control circuit for producing an attenuation signal for attenuating the second electrical signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.