Systems and methods for distortion measurement using distortion-to-amplitude transformations
US8358169B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2010 |
| Grant date | Jan 22, 2013 |
| Priority date | — |
| Expiry date | Jul 19, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03F3/193
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
The presently invention is directed to ways to measure distortion effects while allowing for the possibility of significant reduction in test cost. An exemplary embodiment of the present invention provides a method for amplifier distortion measurement including comparing a first amplitude response of an output signal from a power amplifier to a second amplitude response of a reference input signal to determine a set of Amplitude-to-Amplitude (“AM-AM”) distortion values. Additionally, the method for amplifier distortion measurement includes equalizing the first amplitude response of the output signal to match the second amplitude response of the reference input signal based on the set of AM-AM distortion values and creating a difference signal based on a comparison of the equalized output signal to the reference input signal. Furthermore, the method for amplifier distortion measurement includes calculating a set of Amplitude-to-Phase (“AM-PM”) distortion values based on a third amplitude response of the difference signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.