Method and apparatus for measuring a parameter during the transport of objects to a processing device
US8360230B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 1, 2011 |
| Grant date | Jan 29, 2013 |
| Priority date | — |
| Expiry date | Jul 21, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/0004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and an apparatus measure a quantity parameter during the transport of objects. The objects are in particular flat mail items and are tipped onto a conveyor component of a transport device and are transported by the latter. At least one recording time, in each case at least one photograph of a measurement sector of the conveyor component is taken. For each recording time, the value which a quantity parameter which describes the quantity of objects in the measurement sector has at the recording time is calculated. For this purpose, the proportion of the area of the measurement sector which is covered by objects is measured. A prescribed functional relationship between the quantity parameter and the measured proportion is evaluated. The speed at which the conveyor component transports the objects is changed depending on the quantity parameter value measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.