Techniques for correcting measurement artifacts in magnetic resonance thermometry
US8368401B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 10, 2009 |
| Grant date | Feb 5, 2013 |
| Priority date | — |
| Expiry date | Jul 2, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/56536
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques for correcting measurement artifacts in MR thermometry predict or anticipate movements of objects in or near an MR imaging region that may potentially affect a phase background and then acquire a library of reference phase images corresponding to different phase backgrounds that result from the predicted movements. For each phase image subsequently acquired, one reference phase image is selected from the library of reference phase images to serve as the baseline image for temperature measurement purposes. To avoid measurement artifacts that arise from phase wrapping, the phase shift associated with each phase image is calculated incrementally, that is, by accumulating phase increments from each pair of consecutively scanned phase images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.