Patent · US Active

Multi-position probe circuit tester

US8368415B2 · kind B2 · utility

1Cited by

6References

16Claims

0Family size

Assignee

SPX Corporation · US

Inventors

Thomas Jonathan Jaite · Willoughby Hills, US
Alexander Shaland · Lyndhurst, US
Christopher D. Labedz · Streetsboro, US

Key dates

Filing date	Feb 20, 2009
Grant date	Feb 5, 2013
Priority date	—
Expiry date	Jun 9, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06788
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A circuit tester having a multi-position probe is provided. The circuit tester includes a handle with a detent assembly that allows for positioning the probe at various angles for testing a device. Once a good connection is made with the device under test, an indicator such as a light is lit or a sound is emanated. The probe may be folded into a compartment within the handle once the testing is completed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.