Non-uniformity evaluation apparatus, non-uniformity evaluation method, and display inspection apparatus and program
US8368750B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2009 |
| Grant date | Feb 5, 2013 |
| Priority date | — |
| Expiry date | Jun 7, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A mura evaluation apparatus 100 includes: a mura detection unit 110 that acquires multiple images of a display mura present in a display area of a display device by scanning the display area while moving along a spherical surface with a preset radius; and an information processing apparatus 150 that generates a three-dimensional mura figure from the multiple images acquired by the mura detection unit, by associating a feature value of the display mura in each of the images with a position where the image is acquired, and generates a mura superimposed image in which the three-dimensional mura figure viewed from a designated observation angle is superimposed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.