Measure display SFR using a camera and phase shifting
US8368751B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 2, 2009 |
| Grant date | Feb 5, 2013 |
| Priority date | — |
| Expiry date | Dec 2, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N9/3191
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for measuring the spatial frequency response (SFR) of an imaging system (299) including a display device (280) and an image capture device (290) is disclosed. The method displays a sequence of displayable test pattern images on the display device, the sequence comprising a first test pattern image and at least two subsequent test pattern images, each of the displayable test pattern images including a test pattern having at least one sinusoidal pattern at one or more spatial frequencies such that a phase shift of the sinusoidal pattern has a plurality of pre-determined values. The displayed images are captured with the image capture device to generate a corresponding sequence of captured test pattern images. The captured test pattern images are then compared with the displayable test pattern images to calculate the SFR at a plurality of image locations in the imaging system at the one or more spatial frequencies.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.