Gas analysis arrangement
US8368895B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 21, 2005 |
| Grant date | Feb 5, 2013 |
| Priority date | — |
| Expiry date | Sep 9, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/0303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention comprises a gas analysis arrangement (1), comprising a chamber (20) containing a sample of gas (“G”), light-emitting means (3), means (4) for receiving light that has been reflected through the chamber, and an electronic circuit (5) for calculation, adapted such that it is able by means of spectral analysis to analyze and determine the presence of a selected gas or mixture of gases present as a sample (“G”) of gas within the said chamber (20). The said chamber (20) offers one or several apertures for the passage of the sample of gas into and out of the said chamber. The said chamber (20) is assigned a somewhat curved shape, with at least one concave curved light-reflecting surface (30b) extending between the said light-emitting means (3) and the said light-receiving means (4). The said aperture (30) is located as a narrow continuous extent between the said light-emitting means (3) and the said light-receiving means (4) and that the said aperture (30) is assigned a size and longitudinal extent that offers rapid passive exchange of one sample (“G”) of gas within the chamber (20) for another sample of gas.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.