X-ray inspection device
US8369481B2 · kind B2 · utility
2Cited by
3References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 1, 2010 |
| Grant date | Feb 5, 2013 |
| Priority date | — |
| Expiry date | Dec 30, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/652
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray inspection device includes an X-ray detecting unit, a determining unit, and an output unit. The X-ray detecting unit is configured and arranged to detect a level of X-rays passing through an article. The determining unit is configured to determine a state of the article based on a detection level of the X-rays detected by the X-ray detecting unit using a plurality of thresholds including a first threshold and a second threshold for a single determination criterion. The output unit is configured and arranged to output a result of determination made by the determining unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.