Circuit card assembly testing system for a missile and launcher test set
US8370101B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 27, 2008 |
| Grant date | Feb 5, 2013 |
| Priority date | — |
| Expiry date | Oct 10, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2815
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention generally relates to a circuit card assembly testing system for testing and troubleshooting new and failed circuit card assemblies. Specifically, circuit card assemblies that are part of a guided missile and launcher test set are tested using a board testing system (BTS), the preferred embodiment, to isolate faults or to verify final assembly. The BTS is used for testing and troubleshooting a wide variety of circuit card assemblies at the end of final assembly and upon their return as a failed item from the field. The BTS is designed to rapidly isolate faults in failed circuit card assemblies that have been returned to a maintenance facility by providing an improved means of fault isolation. The BTS is designed to aid in the production of circuit card assemblies by providing an improved means of rapidly verifying the proper operation of circuit boards after final assembly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.