Patent · US Active

High resolution label free analysis of cellular properties

US8372592B2 · kind B2 · utility

0Cited by
169References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 22, 2011
Grant dateFeb 12, 2013
Priority date—
Expiry dateSep 22, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/54373
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention provides methods of detecting a change in cell growth patterns.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.