Automated test equipment employing test signal transmission channel with embedded series isolation resistors
US8373432B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 16, 2010 |
| Grant date | Feb 12, 2013 |
| Priority date | — |
| Expiry date | Oct 1, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31905
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Automated test equipment for high-speed testing of devices under test (DUTs) includes a tester channel circuit generating a high-speed electrical test signal applied to the signal input terminal of each DUT, and a contacter board in physical and electrical contact with the DUTs. The contacter board has a high-speed signal transmission channel including (1) an electrical contact at which the high-speed electrical test signal is received, (2) conductive etch extending from the electrical contact to isolation areas each adjacent to the signal input terminal of a respective DUT, and (3) an embedded series isolation resistor formed on an inner layer of the contacter board at a respective isolation area forming a connection between the conductive etch and the adjacent signal input terminal of the respective DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.