Flat field correction for infrared cameras
US8373757B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 23, 2009 |
| Grant date | Feb 12, 2013 |
| Priority date | — |
| Expiry date | Aug 4, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/76
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Various techniques are provided to perform flat field correction for infrared cameras. In one example, a method of calibrating an infrared camera includes calibrating a focal plane array (FPA) of the infrared camera to an external scene to determine a set of flat field correction values associated with a first optical path from the external scene to the FPA. The method also includes calibrating the FPA to a shutter of the infrared camera to determine a set of flat field correction values associated with a second optical path from the shutter to the FPA. The method also includes using the flat field correction values associated with the first and second optical paths to calculate a set of supplemental flat field correction values to apply to thermal image data obtained with the infrared camera. The method also includes storing the supplemental flat field correction values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.