Patent · US Active

System and method of reading data using a reliability measure

US8374026B2 · kind B2 · utility

28Cited by

11References

21Claims

0Family size

Assignee

SANDISK IL LTD. · IL

Inventors

Eran Sharon · Rishon LeZion, IL
Idan Alrod · Herzliya, IL

Key dates

Filing date	Nov 11, 2010
Grant date	Feb 12, 2013
Priority date	—
Expiry date	May 15, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG11C16/04
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

In a particular embodiment, a data storage device includes a memory array including a target memory cell and one or more other memory cells. The data storage device also includes a controller coupled to the memory array. The controller is configured to directly compute a reliability measure for at least one bit stored in the target memory cell of the memory array based on a voltage value associated with the target memory cell and based on one or more corresponding voltage values associated with each of the one or more other memory cells of the memory array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.