Patent · US Active

Device and method for radiometric measurement of a plurality of samples

US8374802B2 · kind B2 · utility

3Cited by

7References

11Claims

0Family size

Assignee

Eppendorf AG · DE

Inventors

Rainer Treptow · Norderstedt, DE
Gerd Eckert · Hamburg, DE
Andreas Schirr · Hamburg, DE
Rainer Schliesser · Stuhr, DE
Norbert Wittschief · Achim, DE

Key dates

Filing date	Aug 29, 2008
Grant date	Feb 12, 2013
Priority date	—
Expiry date	Feb 18, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/0625
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method for photometrically investigating sample radiations of at least one sample, which are caused by the radiation of N emitter elements of at least one radiation element wherein said N emitter elements are emitting radiation during time periods which at least partially overlap, to detect the sample radiation of at least two samples as a sum signal during time periods which at least partially overlap and to evaluate the sample radiation of at least one individual sample from said sum signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.