Methods and apparatus for monitoring and conditioning strip material
US8375754B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 2008 |
| Grant date | Feb 19, 2013 |
| Priority date | — |
| Expiry date | Nov 7, 2028 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB21B2263/08
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
Methods and an apparatus for monitoring and conditioning strip material are disclosed. A disclosed example apparatus includes a plurality of sensors positioned across a width of a strip material, each of the plurality of sensors corresponding to a different one of a plurality of longitudinal zones along the width of the strip material. The example apparatus also includes a material condition monitor to determine a plurality of wave heights of the strip material based on information received from the plurality of sensors. Each of the wave heights corresponds to a respective one of the plurality of longitudinal zones. The material condition monitor is also to determine whether a measured portion of the strip material is substantially flat based on a comparison of each of the wave heights to a threshold value. When the strip material is not substantially flat, the material condition monitor is to perform a plurality of zone-to-zone comparisons by comparing at least some of the wave heights to each other and generating a first signal to condition a first one of the plurality of zones of the strip material based on at least one of the zone-to-zone comparisons.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.