Method for characterizing the sensitivity of an electronic component to energetic interactions
US8378696B2 · kind B2 · utility
2Cited by
6References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 5, 2008 |
| Grant date | Feb 19, 2013 |
| Priority date | — |
| Expiry date | Oct 3, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The behavior of a component subjected to pulsed laser radiation is measured. The polarization value, frequency, and temperature (or other operating conditions) to which the component is sensitive are determined by detecting a temporary or permanent fault in the operation of the component. If necessary, the parasitic currents generated are prevented from destroying the tested component at the time of testing. A susceptibility of the component to energetic interactions and the preferred operating conditions for the component are deduced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.