Patent · US Active

System and method for optical sensor interrogation

US8379217B2 · kind B2 · utility

3Cited by

9References

27Claims

0Family size

Assignee

General Electric Company · US

Inventors

Glen Peter Koste · Niskayuna, US
Richard Louis Frey · Delanson, US
Joseph Alfred Iannotti · Glenville, US

Key dates

Filing date	Mar 23, 2006
Grant date	Feb 19, 2013
Priority date	—
Expiry date	Dec 10, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/35316
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An optical sensor interrogation system comprises: a multi-frequency optical source configured to generate an optical interrogation signal, at least one optical sensor configured to filter light at a wavelength corresponding to a value of a sensed parameter and generate an optical sensor data signal, a photodetector configured to detect a reference signal and the optical sensor data signal and generate an electrical difference frequency signal corresponding to a wavelength difference between the reference signal and the optical sensor data signal, and an electrical frequency measurement module configured to measure the electrical difference frequency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.