Dynamic test coverage
US8381184B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 2, 2008 |
| Grant date | Feb 19, 2013 |
| Priority date | — |
| Expiry date | Jun 2, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3676
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Dynamic test coverage to evaluate an artifact code is provided. Code of an artifact to be tested is identified. The code coverage of the test code is analyzed. The current coverage information is stored. Code coverage information for one or more prior versions of the test code is retrieved. The current coverage information is compared with the prior coverage information. Responsive to a determination that a difference between the current coverage information and the prior coverage information exists, the difference is collected. Responsive to a determination that test cases are to be generated automatically, generating, automatically, new test cases based on the difference. The new test cases are stored. Code coverage of the test code is analyzed based on the new test case. The new coverage information is stored. The new coverage information is sent to the user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.