Procedure and device for detecting manipulations at lambda probes
US8381567B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 3, 2009 |
| Grant date | Feb 26, 2013 |
| Priority date | — |
| Expiry date | May 22, 2031 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02T10/40
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
A procedure for detecting manipulations at lambda comprises the following steps; the lambda probe is excited by at least one electric excitation signal; at least one electric response signal of the probe is detected; the at least one response signal is compared to at least one default electric response signal that characterizes a not manipulated probe; the deviation of the detected at least one electric response signal from the at least one default electric response signal is used for detecting a manipulation of the probe. A device for detecting manipulations at lambda probes characterized by a switch assembly, with which the probe can be impinged with an electric excitation signal, in particular a step-wise electric excitation, preferably with a current impulse, by a evaluation switch device for evaluating a response signal, in particular the probe voltage and for comparing the excitation signal with the response signal and for assuming a manipulation in the case of a deviation of the response signal from a response signal that characterizes a not manipulated probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.