Patent · US Active

Evaluating an electromagnetic field strength of an electromagnetic gate apparatus

US8381980B2 · kind B2 · utility

0Cited by

0References

10Claims

0Family size

Assignee

NXP B.V. · NL

Inventors

Gerald Wiednig · Stainz, AT
Michael Buchmann · Duisburg, DE
Ronny Schomacker · Gratwein-Straßengel, AT

Key dates

Filing date	Jan 8, 2009
Grant date	Feb 26, 2013
Priority date	—
Expiry date	Aug 9, 2029

Classification

Technology area (CPC H)Electricity
CPC primaryH04B17/318
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

A device (110) for evaluating an electromagnetic field strength/field geometry of an electromagnetic gate apparatus (120) is provided, the device (110) comprising a measurement unit (112) adapted for receiving a measurement signal from the electromagnetic gate apparatus (120) and determining a value of the field strength of said measurement signal, a communication unit (114) adapted for receiving command data from the electromagnetic gate apparatus (120) and adapted for sending response datato the electromagnetic gate apparatus (120). Optionally, the device (110) comprises an evaluation unit (116,118) adapted for evaluating the electromagnetic field geometry of the electromagnetic gate apparatus (120) based on said values of the field strength received from the measurement unit (112).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.