Patent · US Active

Configuration of optimized custom properties in a data finder tool

US8386464B2 · kind B2 · utility

2Cited by

5References

15Claims

0Family size

Assignee

National Instruments Corporation · US

Inventors

Andreas Peter Haub · Roetgen, DE
Stefan Romainczyk · Aachen, DE
Ralf Deininger · Aachen, DE
Helmut Helpenstein · Erkelenz, DE
Andreas Krantz · Zülpich, DE
Myrle H. Krantz · Aachen, DE
Eva Wolpers · Würselen, DE

Key dates

Filing date	Mar 26, 2007
Grant date	Feb 26, 2013
Priority date	—
Expiry date	Aug 24, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG06F16/907
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.