Fault localization using directed test generation
US8387018B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2010 |
| Grant date | Feb 26, 2013 |
| Priority date | — |
| Expiry date | Aug 16, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a novel computer implemented system, on demand service, computer program product and a method for fault-localization techniques that apply statistical analyses to execution data gathered from multiple tests. The present invention determines the fault-localization effectiveness of test suites generated according to several test-generation techniques based on combined concrete and symbolic (concolic) execution. These techniques are evaluated by applying the Ochiai fault-localization technique to generated test suites in order to localize 35 faults in four PHPWeb applications. The results show that the test-generation techniques under consideration produce test suites with similar high fault-localization effectiveness, when given a large time budget.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.