Patent · US Active

Cerium oxide powder, method for preparing the same, and CMP slurry comprising the same

US8388710B2 · kind B2 · utility

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3References
2Claims
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Key dates

Filing dateMar 20, 2008
Grant dateMar 5, 2013
Priority date
Expiry dateMar 20, 2028

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/2982
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

Disclosed is cerium oxide powder for a CMP abrasive, which can improve polishing selectivity of a silicon oxide layer to a silicon nitride layer and/or within-wafer non-uniformity (WIWNU) during chemical mechanical polishing in a semiconductor fabricating process. More particularly, the cerium oxide powder is obtained by using cerium carbonate having a hexagonal crystal structure as a precursor. Also, CMP slurry comprising the cerium oxide powder as an abrasive, and a shallow trench isolation method for a semiconductor device using the CMP slurry as polishing slurry are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.