Sensing capacitance changes of a housing of an electronic device
US8390481B2 · kind B2 · utility
77Cited by
14References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 17, 2009 |
| Grant date | Mar 5, 2013 |
| Priority date | — |
| Expiry date | Nov 13, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2217/960785
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and apparatuses are disclosed that allow measurement of a user's interaction with the housing of an electronic device. Some embodiments may measure the electrical characteristics of a housing of an electrical device, where the housing is capable of being temporarily deformed by the user's interaction. By measuring the electrical characteristics of the housing, such as the housing's capacitance, the user's interaction with the housing can be measured in a manner that is independent of the user's electrical characteristics and/or in a manner that may allow the pressure applied to the housing to be quantified.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.