Calibration device and optical characteristic measuring system using the same
US8390803B2 · kind B2 · utility
1Cited by
6References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2010 |
| Grant date | Mar 5, 2013 |
| Priority date | — |
| Expiry date | Sep 9, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/0272
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A calibration device 21 according to the present invention is a member used for white calibration of an optical characteristic measuring apparatus 1 for measuring an optical characteristic of a specimen arranged to close a measuring opening and is used together with a spacer 24. Accordingly, such a calibration device 21 can perform more accurate white calibration by preventing formation of an interference pattern by the spacer 24.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.