Three-dimensional sensing using speckle patterns
US8390821B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 8, 2007 |
| Grant date | Mar 5, 2013 |
| Priority date | — |
| Expiry date | Mar 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/557
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Apparatus (20) for 3D mapping of an object (28) includes an illumination assembly (30), including a coherent light source (32) and a diffuser (33), which are arranged to project a primary speckle pattern on the object. A single image capture assembly (38) is arranged to capture images of the primary speckle pattern on the object from a single, fixed location and angle relative to the illumination assembly. A processor (24) is coupled to process the images of the primary speckle pattern captured at the single, fixed angle so as to derive a 3D map of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.