Double data rate (DDR) counter, analog-to-digital converter (ADC) using the same, CMOS image sensor using the same and methods in DDR counter, ADC and CMOS image sensor
US8395539B2 · kind B2 · utility
15Cited by
12References
30Claims
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Key dates
| Filing date | Dec 7, 2009 |
| Grant date | Mar 12, 2013 |
| Priority date | — |
| Expiry date | Aug 28, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/709
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
In a double data rate (DDR) counter and counting method used in, for example, an analog-to-digital conversion in, for example, a CMOS image sensor and method, a first stage of the counter generates a least significant bit (LSB) of the value in the counter. The counter includes at least one second stage for generating another bit of the value in the counter. An input clock signal is applied to a data input of the first stage and a clock input of the second stage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.