Supervised edge detection using fractal signatures
US8396297B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 27, 2008 |
| Grant date | Mar 12, 2013 |
| Priority date | — |
| Expiry date | Jan 11, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/443
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems to identify image pixels as edge pixels using fractal signatures associated with the image pixels. Fractal signatures may include one or more of a variety of fractal dimensions. A fractal dimension of a pixel may be generated from an array of pixels that include the pixel, from x and y coordinates and one or more of luminosity values and color values associated with pixels in the array of pixels. Pixels may be identified as edge pixels when their corresponding fractal signatures are equal to or greater than a fractal signature threshold. The fractal signature threshold may be generated in a supervised fashion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.