Merged ion beam tandem TOF-TOF mass spectrometer
US8399828B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 31, 2009 |
| Grant date | Mar 19, 2013 |
| Priority date | — |
| Expiry date | Dec 31, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/107
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A tandem time-of-flight mass spectrometer includes a first pulsed ion source that produces ions with a first mass and charge that directs the ions into a first stage of a tandem TOF mass spectrometer. In addition, a second pulsed ion source produces ions with a second mass and an opposite charge directs the ions into the first stage of the tandem TOF mass spectrometer. A field-free reaction region is positioned in the ion flight path so that ions from first and second pulsed ion source arrive at the entrance of the field-free reaction region substantially simultaneously in at least one of time and space. At least some of the ions from the first and second pulsed ion source are fragmented by ion-ion collision between positive and negative ions. A second stage of the tandem mass spectrometer separates fragment ions produced in the reaction region according to their mass-to-charge ratio.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.